Explore challenges and solutions in AI chip development
Optimize silicon performance, accelerate chip design and improve efficiency throughout the entire EDA flow with our advanced suite of AI-driven solutions. Award-winning Synopsys.ai offers industry leading AI-driven workflow optimization and data analytics solutions along with breakthrough generative AI capabilities, allowing engineers to accelerate innovation and time to market. Join us to explore how we can help drive your chip design to the next level.
Synopsys.ai Copilot is the first of its kind EDA technology to leverage generative AI across the entire design stack, providing you expertise right at your fingertips.
Synopsys.ai Copilot transforms design workflows, enabling teams of all experience levels to innovate faster and smarter.
Synopsys.ai™ is the industry’s first electronic design automation (EDA) solution suite to use the power of AI from system architecture through to manufacturing. Synopsys.ai suite quickly handles design complexity and takes over repetitive tasks such as design space exploration, verification coverage and regression analytics, and test program generation, while helping to optimize power, performance, and area. This frees up engineers to focus on chip quality and differentiation. AI capabilities can help teams quickly migrate their chip designs from foundry to foundry or from process node to process node. Synopsys.ai empowers engineers to get the right chip with the right specs to market faster. Learn more about how these AI-driven solutions can accelerate the design of your chip.
Synopsys.ai also delivers the industry’s first data continuum solution to accelerate chip design, verification, and high-volume manufacturing. This AI-driven data analytics solution allows teams to unlock, connect, and analyze the vast amount of data collected across design, verification, manufacturing, test, and in-field operations. Its unique chip monitor technology enables optimization of power, performance, quality, yield, and throughput. The solution's consolidated visualization accelerates root cause analysis at any stage of the IC lifecycle.